Easy-to-use. Compact. Increased performance.

The MiniScan EZ 4000L is a large area view diffuse illumination spectrophotometer. This large area view portable spectrophotometer provides a 25mm port size that has a 20mm view area. This product is ideal for a wide range of sample types and is especially useful for measurement where user wishes to minimize the effect of gloss or sample texture.

Explore all the additional features and benefits below.

• 📷Sphere geometry with large area view
• 📷Light weight with rubberized handle for operator comfort
• 📷Easy one-handed operation with thumb-tip navigation of functions
• 📷Large, easy to read LCD graphical display
• 📷Displays color data, color difference data, color plot, spectral data, spectral data difference, spectral plot, spectral difference plot
• 📷Includes all commonly used color scales and indices
• 📷Averages up to 20 sample readings
• 📷Stores 100 standards and 800 sample measurement

Product Specifications

Measurement Principle: Dual-beam spectrophotometer

Geometries:

• Diffuse/8° (specular component included)

Spectrophotometer: 256 element diode array and high resolution, concave holographic grating

Sphere Diameter: 63.5 mm (2.5 in.) (diffuse/8° models)

Port Diameters/View Diameters

Diffuse/8° models:

• LAV 25.4 mm (1 in) illuminated/20.0 mm (0.8 in) measured

Specular Component: Included on Diffuse/8° models

Spectral Range: 400 nm - 700 nm

Spectral Resolution: < 3 nm

Effective Bandwidth: 10 nm equivalent triangular

Reporting Interval: 10 nm

Photometric Range: 0 to 150 %

Light Source: Pulsed Xenon Lamp

Flashes per Measurement: 1 flash

Lamp Life: > 1 million flashes

Measurement Time: < 1 second from button push to measurement 2 seconds from button push to data display

Minimum Interval between Measurements: 3 seconds

Standards Conformance: CIE 15:2004, ISO 7724/1, ASTM E1164, DIN 5033 Teil 7 and JIS Z 8722 Condition C

Standards Traceability: Instrument standard assignment in accordance with National Institute of Standards and Technology (NIST) following practices described in CIE Publication 44 and ASTM E259